This submodule contains a collection of YANG definitions for Metallic Line Test Processing (MELT-P) derived parameters. Copyrig...
Version: 2020-10-13
submodule bbf-melt-processing-derived-parameter-body { yang-version 1.1; belongs-to bbf-melt { prefix bbf-melt; } include bbf-melt-base; organization "Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area"; contact "Comments or questions about this Broadband Forum YANG module should be directed to <mailto:help@broadband-forum.org>. Editor: Ken Kerpez, ASSIA, Inc. Editor: Joey Boyd, ADTRAN PS Leader: Sowrirajan Padmanabhan, Nokia PS Leader: Joey Boyd, ADTRAN WA Director: Sven Ooghe, Nokia WA Director: Joey Boyd, ADTRAN"; description "This submodule contains a collection of YANG definitions for Metallic Line Test Processing (MELT-P) derived parameters. Copyright (c) 2016-2020 Broadband Forum Redistribution and use in source and binary forms, with or without modification, are permitted provided that the following conditions are met: 1. Redistributions of source code must retain the above copyright notice, this list of conditions and the following disclaimer. 2. Redistributions in binary form must reproduce the above copyright notice, this list of conditions and the following disclaimer in the documentation and/or other materials provided with the distribution. 3. Neither the name of the copyright holder nor the names of its contributors may be used to endorse or promote products derived from this software without specific prior written permission. THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE. The above license is used as a license under copyright only. Please reference the Forum IPR Policy for patent licensing terms <https://www.broadband-forum.org/ipr-policy>. Any moral rights which are necessary to exercise under the above license grant are also deemed granted under this license. This version of this YANG module is part of TR-355a3; see the TR itself for full legal notices."; revision "2020-10-13" { description "Amendment 3. * Approval Date: 2020-10-13 * Publication Date: 2020-10-13."; reference "TR-355a3: YANG Modules for FTTdp Management <https://www.broadband-forum.org/download/ TR-355_Amendment-3.pdf>"; } revision "2019-06-17" { description "Changes for amendment 3."; reference "TBD"; } revision "2019-06-11" { description "Amendment 2. * Approval Date: 2019-06-11 * Publication Date: 2019-06-11."; reference "TR-355a2: YANG Modules for FTTdp Management <https://www.broadband-forum.org/technical/download/ TR-355_Amendment-2.pdf>"; } revision "2018-10-01" { description "Amendment 1. * Approval Date: 2018-10-01 * Publication Date: 2018-10-01."; reference "TR-355a1: YANG Modules for FTTdp Management <https://www.broadband-forum.org/technical/download/ TR-355_Amendment-1.pdf>"; } revision "2016-07-18" { description "Initial revision. * Approval Date: see revision date above. * Publication Date: 2016-08-05."; reference "TR-355: YANG Modules for FTTdp Management <https://www.broadband-forum.org/technical/download/ TR-355.pdf>"; } typedef melt-processing-derived-parameter { type enumeration { enum "open-wire-failure-type" { value 0; description "This sub-parameter is a five state indication of the type of open wire failure defined as follows: 1) No open wire failure detected 2) Tip and ring wires open in equal distance 3) Tip wire open 4) Ring wire open 5) Undefined. NOTE - An error-free loop will be classified as failure state 2) in case that the remote end of the loop was left open during the measurement, or the connected CPE equipment could not be detected (too low parallel CPE system capacitance)."; reference "ITU-T G.996.2 clause F.2.2.1.1 (MELT-O-WIRE-type)"; } enum "open-wire-failure-distance" { value 1; description "This parameter represents a best-effort estimate of the distance of the detected open wire failure from the measurement point, i.e., from the central office or of the total loop length if no failure is detected. A priori knowledge of the loop characteristics is required for reliable estimation of the distance (see clause F.2.1.2). The range of valid values is from 0 to 10000 m with a granularity of 1 m."; reference "ITU-T G.996.2 clause F.2.2.1.2 (MELT-O-WIRE-DIST)"; } enum "short-circuit-failure-type" { value 2; description "This parameter is a six-state indication of the type of short circuit failure defined as follows: 1) No short circuit detected 2) Tip and ring wires shorted to GND 3) Tip wire shorted to GND 4) Ring wire shorted to GND 5) Tip and ring wires shorted to each other 6) Undefined."; reference "ITU-T G.996.2 clause F.2.2.2.1 (MELT-S-CCT-type)"; } enum "leakage-identification" { value 3; description "This parameter indicates a leakage to GND failure, classified into the following states: 1) No leakage detected 2) Tip and ring wire leaking to GND 3) Tip wire leaking to GND 4) Ring wire leaking to GND."; reference "ITU-T G.996.2 clause F.2.2.3 (MELT-LEAK-ID)"; } enum "resistive-fault-identification" { value 4; description "This parameter indicates a resistive fault to GND failure, classified into the following states: 1) No resistive fault detected 2) Resistive fault tip and ring to GND 3) Resistive fault tip to GND 4) Resistive fault ring to GND."; reference "ITU-T G.996.2 clause F.2.2.4 (MELT-RFAULT-ID)"; } enum "foreign-voltage-type-classification" { value 5; description "The foreign voltage impairment in the loop under test is classified into the following states: 1) No foreign voltage detected 2) 16 2/3 Hz AC voltage 3) 25 Hz AC voltage 4) 50 Hz AC voltage 5) 60 Hz AC voltage 6) POTS equipment (-48 V DC) 7) ISDN equipment (-96 V DC) 8) Undefined foreign voltage detected. This classification shall be done separately for both, the tip and the ring wire. "; reference "ITU-T G.996.2 clause F.2.2.5.1 (MELT-FV-TYPE)"; } enum "foreign-voltage-level-classification" { value 6; description "This parameter provides a general classification of the foreign voltage into the following classes: 1) hazardous potential (e.g., power contact) 2) foreign electromotive force 3) other."; reference "ITU-T G.996.2 clause F.2.2.5.2 (MELT-FV-LEVEL)"; } enum "far-end-signature-topology-type-identification" { value 7; description "This parameter specifies the topology types of the detected far-end signature. Valid response values are: - no signature detected - unknown signature - signature type DR detected - signature type ZRC detected."; reference "ITU-T G.996.2 clause F.2.2.6.1 (MELT-FES-ID)"; } enum "cpe-identification-capacitive" { value 8; description "CPE detected shall be reported if the measured capacitance value CTR-Term is >= MELT-SYSC-CPE. CTR-Term shall represent the termination capacitance only. Therefore, the line capacitance shall be subtracted from the measured CTR value. For this equation to hold, the MELT-SYSC-CPE value should be derived from the nominal CPE capacitance by accounting for all tolerances and be set to the minimum possible measurement result."; reference "ITU-T G.996.2 clause F.2.2.7 (MELT-CPE-ID)"; } } description "An enumerated list of MELT processing derived parameters."; } grouping processing-derived-parameters { description "Defines the Metallic Line Test Processing (MELT-P) derived parameters."; leaf open-wire-failure-type { type enumeration { enum "no-open" { value 0; description "No open wire failure detected."; } enum "tip-ring-open" { value 1; description "Tip and ring wires open in equal distance."; } enum "tip-open" { value 2; description "Tip wire open."; } enum "ring-open" { value 3; description "Ring wire open."; } enum "undefined" { value 4; description "Undefined."; } } description "This sub-parameter is a five state indication of the type of open wire failure defined as follows: 1) No open wire failure detected 2) Tip and ring wires open in equal distance 3) Tip wire open 4) Ring wire open 5) Undefined. NOTE - An error-free loop will be classified as failure state 2) in case that the remote end of the loop was left open during the measurement, or the connected Customer Premises Equipment (CPE) could not be detected (too low parallel CPE system capacitance)."; reference "ITU-T G.996.2 clause F.2.2.1.1 (MELT-O-WIRE-type)"; } leaf open-wire-failure-distance { type uint16 { range "0..10000"; } units "1 m"; description "This parameter represents a best-effort estimate of the distance of the detected open wire failure from the measurement point, i.e., from the central office or of the total loop length if no failure is detected. A priori knowledge of the loop characteristics is required for reliable estimation of the distance (see clause F.2.1.2). The range of valid values is from 0 to 10000 m with a granularity of 1 m."; reference "ITU-T G.996.2 clause F.2.2.1.2 (MELT-O-WIRE-DIST)"; } leaf short-circuit-failure-type { type enumeration { enum "no-short" { value 0; description "No short circuit detected."; } enum "tip-ring-short-to-ground" { value 1; description "Tip and ring wires shorted to ground (GND)."; } enum "tip-short-to-ground" { value 2; description "Tip wire shorted to ground (GND)."; } enum "ring-short-to-ground" { value 3; description "Ring wire shorted to ground (GND)."; } enum "tip-ring-short-to-each-other" { value 4; description "Tip and ring wires shorted to each other."; } enum "undefined" { value 5; description "Undefined."; } } description "This parameter is a six-state indication of the type of short circuit failure defined as follows: 1) No short circuit detected 2) Tip and ring wires shorted to GND 3) Tip wire shorted to GND 4) Ring wire shorted to GND 5) Tip and ring wires shorted to each other 6) Undefined."; reference "ITU-T G.996.2 clause F.2.2.2.1 (MELT-S-CCT-type)"; } leaf leakage-identification { type enumeration { enum "no-leakage" { value 0; description "No leakage detected."; } enum "tip-ring-leaking" { value 1; description "Tip and ring wire leaking to ground (GND)."; } enum "tip-leaking" { value 2; description "Tip wire leaking to ground (GND)."; } enum "ring-leaking" { value 3; description "Ring wire leaking to ground (GND)."; } } description "This parameter indicates a leakage to ground (GND) failure, classified into the following states: 1) No leakage detected 2) Tip and ring wire leaking to GND 3) Tip wire leaking to GND 4) Ring wire leaking to GND."; reference "ITU-T G.996.2 clause F.2.2.3 (MELT-LEAK-ID)"; } leaf resistive-fault-identification { type enumeration { enum "no-fault" { value 0; description "No resistive fault detected."; } enum "tip-ring-fault" { value 1; description "Resistive fault tip and ring to ground (GND)."; } enum "tip-fault" { value 2; description "Resistive fault tip to ground (GND)."; } enum "ring-fault" { value 3; description "Resistive fault ring to ground (GND)."; } } description "This parameter indicates a resistive fault to ground (GND) failure, classified into the following states: 1) No resistive fault detected 2) Resistive fault tip and ring to GND 3) Resistive fault tip to GND 4) Resistive fault ring to GND."; reference "ITU-T G.996.2 clause F.2.2.4 (MELT-RFAULT-ID)"; } leaf foreign-voltage-type-classification { type enumeration { enum "no-foreign-voltage-detected" { value 0; description "No foreign voltage detected."; } enum "16-hz-ac-voltage" { value 1; description "16 2/3 Hz AC voltage on both tip and ring wires."; } enum "25-hz-ac-voltage" { value 2; description "25 Hz AC voltage on both tip and ring wires."; } enum "50-hz-ac-voltage" { value 3; description "50 Hz AC voltage on both tip and ring wires."; } enum "60-hz-ac-voltage" { value 4; description "60 Hz AC voltage on both tip and ring wires."; } enum "pots-equipment" { value 5; description "POTS equipment (-48 V DC) on both tip and ring wires."; } enum "isdn-equipment" { value 6; description "ISDN equipment (-96 V DC) on both tip and ring wires."; } enum "undefined-foreign-voltage-detected" { value 7; description "Undefined foreign voltage detected on both tip and ring wires."; } enum "16-hz-ac-voltage-tip" { value 8; description "16 2/3 Hz AC voltage on the tip wire."; } enum "16-hz-ac-voltage-ring" { value 9; description "16 2/3 Hz AC voltage on the ring wire."; } enum "25-hz-ac-voltage-tip" { value 10; description "25 Hz AC voltage on the the tip wire."; } enum "25-hz-ac-voltage-ring" { value 11; description "25 Hz AC voltage on the the ring wire."; } enum "50-hz-ac-voltage-tip" { value 12; description "50 Hz AC voltage on the tip wire."; } enum "50-hz-ac-voltage-ring" { value 13; description "50 Hz AC voltage on the ring wire."; } enum "60-hz-ac-voltage-tip" { value 14; description "60 Hz AC voltage on the tip wire."; } enum "60-hz-ac-voltage-ring" { value 15; description "60 Hz AC voltage on the ring wire."; } enum "pots-equipment-tip" { value 16; description "POTS equipment (-48 V DC) on the tip wire."; } enum "pots-equipment-ring" { value 17; description "POTS equipment (-48 V DC) on the ring wire."; } enum "isdn-equipment-tip" { value 18; description "ISDN equipment (-96 V DC) on the tip wire."; } enum "isdn-equipment-ring" { value 19; description "ISDN equipment (-96 V DC) on the ring wire."; } enum "undefined-foreign-voltage-detected-tip" { value 20; description "Undefined foreign voltage detected on the tip wire."; } enum "undefined-foreign-voltage-detected-ring" { value 21; description "Undefined foreign voltage detected on the ring wire."; } } description "The foreign voltage impairment in the loop under test is classified into the following states: 1) No foreign voltage detected 2) 16 2/3 Hz AC voltage 3) 25 Hz AC voltage 4) 50 Hz AC voltage 5) 60 Hz AC voltage 6) POTS equipment (-48 V DC) 7) ISDN equipment (-96 V DC) 8) Undefined foreign voltage detected. This classification shall be done separately for both, the tip and the ring wire."; reference "ITU-T G.996.2 clause F.2.2.5.1 (MELT-FV-TYPE)"; } leaf foreign-voltage-level-classification { type enumeration { enum "hazardous-potential" { value 0; description "Hazardous potential (e.g., power contact)."; } enum "foreign-electromotive-force" { value 1; description "Foreign electromotive force."; } enum "other" { value 2; description "Other."; } } description "This parameter provides a general classification of the foreign voltage into the following classes: 1) hazardous potential (e.g., power contact) 2) foreign electromotive force 3) other."; reference "ITU-T G.996.2 clause F.2.2.5.2 (MELT-FV-LEVEL)"; } leaf far-end-signature-topology-type-identification { type enumeration { enum "no-signature-detected" { value 0; description "No signature detected."; } enum "unknown-signature" { value 1; description "Unknown signature."; } enum "signature-type-dr" { value 2; description "Signature type DR detected."; } enum "signature-type-zrc" { value 3; description "Signature type ZRC detected."; } enum "signature-type-dr-inverse" { value 4; description "Signature type DR inverse detected."; } enum "signature-type-dr-plus-zrc" { value 5; description "Signature types DR and XRC detected."; } enum "signature-type-dr-inverse-plus-zrc" { value 6; description "Signature types DR inverse and XRC detected."; } } description "This parameter specifies the topology types of the detected far-end signature. Valid response values are: - no signature detected - unknown signature - signature type DR detected - signature type ZRC detected."; reference "ITU-T G.996.2 clause F.2.2.6.1 (MELT-FES-ID)"; } leaf cpe-identification-capacitive { type enumeration { enum "no-cpe-detected" { value 0; description "No CPE has been detected."; } enum "cpe-detected" { value 1; description "A CPE has been detected."; } } description "CPE detected shall be reported if the measured capacitance value CTR-Term is >= MELT-SYSC-CPE. CTR-Term shall represent the termination capacitance only. Therefore, the line capacitance shall be subtracted from the measured CTR value. For this equation to hold, the MELT-SYSC-CPE value should be derived from the nominal CPE capacitance by accounting for all tolerances and be set to the minimum possible measurement result."; reference "ITU-T G.996.2 clause F.2.2.7 (MELT-CPE-ID)"; } leaf unreliability-indicator { if-feature melt-processing-derived-parameter-reliability; type bits { bit open-wire-failure-type { position 0; description "This sub-parameter is a five state indication of the type of open wire failure defined as follows: 1) No open wire failure detected 2) Tip and ring wires open in equal distance 3) Tip wire open 4) Ring wire open 5) Undefined. NOTE - An error-free loop will be classified as failure state 2) in case that the remote end of the loop was left open during the measurement, or the connected CPE equipment could not be detected (too low parallel CPE system capacitance)."; reference "ITU-T G.996.2 clause F.2.2.1.1 (MELT-O-WIRE-type)"; } bit open-wire-failure-distance { position 1; description "This parameter represents a best-effort estimate of the distance of the detected open wire failure from the measurement point, i.e., from the central office or of the total loop length if no failure is detected. A priori knowledge of the loop characteristics is required for reliable estimation of the distance (see clause F.2.1.2). The range of valid values is from 0 to 10000 m with a granularity of 1 m."; reference "ITU-T G.996.2 clause F.2.2.1.2 (MELT-O-WIRE-DIST)"; } bit short-circuit-failure-type { position 2; description "This parameter is a six-state indication of the type of short circuit failure defined as follows: 1) No short circuit detected 2) Tip and ring wires shorted to GND 3) Tip wire shorted to GND 4) Ring wire shorted to GND 5) Tip and ring wires shorted to each other 6) Undefined."; reference "ITU-T G.996.2 clause F.2.2.2.1 (MELT-S-CCT-type)"; } bit leakage-identification { position 3; description "This parameter indicates a leakage to GND failure, classified into the following states: 1) No leakage detected 2) Tip and ring wire leaking to GND 3) Tip wire leaking to GND 4) Ring wire leaking to GND."; reference "ITU-T G.996.2 clause F.2.2.3 (MELT-LEAK-ID)"; } bit resistive-fault-identification { position 4; description "This parameter indicates a resistive fault to GND failure, classified into the following states: 1) No resistive fault detected 2) Resistive fault tip and ring to GND 3) Resistive fault tip to GND 4) Resistive fault ring to GND."; reference "ITU-T G.996.2 clause F.2.2.4 (MELT-RFAULT-ID)"; } bit foreign-voltage-type-classification { position 5; description "The foreign voltage impairment in the loop under test is classified into the following states: 1) No foreign voltage detected 2) 16 2/3 Hz AC voltage 3) 25 Hz AC voltage 4) 50 Hz AC voltage 5) 60 Hz AC voltage 6) POTS equipment (-48 V DC) 7) ISDN equipment (-96 V DC) 8) Undefined foreign voltage detected. This classification shall be done separately for both, the tip and the ring wire."; reference "ITU-T G.996.2 clause F.2.2.5.1 (MELT-FV-TYPE)"; } bit foreign-voltage-level-classification { position 6; description "This parameter provides a general classification of the foreign voltage into the following classes: 1) hazardous potential (e.g., power contact) 2) foreign electromotive force 3) other."; reference "ITU-T G.996.2 clause F.2.2.5.2 (MELT-FV-LEVEL)"; } bit far-end-signature-topology-type-identification { position 7; description "This parameter specifies the topology types of the detected far-end signature. Valid response values are: - no signature detected - unknown signature - signature type DR detected - signature type ZRC detected."; reference "ITU-T G.996.2 clause F.2.2.6.1 (MELT-FES-ID)"; } bit cpe-identification-capacitive { position 8; description "CPE detected shall be reported if the measured capacitance value CTR-Term is >= MELT-SYSC-CPE. CTR-Term shall represent the termination capacitance only. Therefore, the line capacitance shall be subtracted from the measured CTR value. For this equation to hold, the MELT-SYSC-CPE value should be derived from the nominal CPE capacitance by accounting for all tolerances and be set to the minimum possible measurement result."; reference "ITU-T G.996.2 clause F.2.2.7 (MELT-CPE-ID)"; } } description "The unreliability indicator provides the set of parameters whose data can be considered to be unreliable. Possible reasons that the data is unreliable: - The measurement may not have been able to run, possibly due to external conditions. - The result is not reliable as the accuracy may be degraded due to external conditions."; reference "ITU-T G.996.2 clause F.2.2.8 (Reliability indicator)"; } container melt-processing-derived-vendor-specific-status { if-feature melt-processing-derived-parameter-reliability; description "Vendor specific status associated with each MELT processing derived test."; list status { key "parameter"; description "A list of per parameter test status."; leaf parameter { type melt-processing-derived-parameter; description "The MELT processing derived parameter."; } leaf message { type string; description "Vendor specific status message for each of the MELT processing derived parameters."; } } // list status } // container melt-processing-derived-vendor-specific-status } // grouping processing-derived-parameters } // submodule bbf-melt-processing-derived-parameter-body
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